UF MURI Reliability

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A 21st Century Approach To Electronic Reliability

Department of Defense

Air Force Office of Scientific Research

We have AFOSR support for developing new approaches to verifying reliability in electronics. There are five main thrust areas:

Thrust 1 - Device Fabrication Support

Thrust 2 - Materials Characterization

Thrust 3 - Electrical Characterization

Thrust 4 - Modeling and Simulation

Thrust 5 - Statistical Support

The FLOOPS and FLOODS software is available for download with a signed license form. The manual (which needs updating) is also online.

Here are overview slides from the ROCS workshops.