UF MURI Reliability
From Reliability
(Redirected from Main Page)
Contents |
A 21st Century Approach To Electronic Reliability
Department of Defense
Air Force Office of Scientific Research
We have AFOSR support for developing new approaches to verifying reliability in electronics. There are five main thrust areas:
Thrust 1 - Device Fabrication Support
Thrust 2 - Materials Characterization
Thrust 3 - Electrical Characterization
Thrust 4 - Modeling and Simulation
Thrust 5 - Statistical Support
Upcoming Events
Annual Review Meeting September 21-22, 2009
Active Faculty
- Mark Law
- Steve Pearton
- Cammy Abernathy
- Gijs Bosman
- Brent Gila
- Kevin Jones
- Toshi Nishida
- Fan Ren
- Scott Thompson
Resources
IEEE DMR Special Issue on III-V Reliability
The FLOOPS and FLOODS software is available for download with a signed license form. The manual (which needs updating) is also online.
Here are overview slides from the ROCS workshops.
Past Events and Activities
- Annual Review Meeting March 16, 2009
- MURI Kick Off Meeting July 24, 2008
